CdSe and US F. films, deposited on a sapphire substrate by means of pulsed laser ablation technique, have been investigated by means of reflectivity and photoluminescence measurements in order to study the effect of such a transparent substrate on the optical properties of the deposited epilayers. The reflectivity spectra at low temperature have been studied by means of an analytical model which permits one to obtain the energies of the excitonic resonances. The photoluminescence spectra show that our CdSe and US films present excitonic emission at low temperature, differently from the same films deposited on quartz. The temperature dependence of the excitonic energy has been analysed by taking into account the contribution of both the thermal expansion and electron-phonon interaction. The exciton linewidth has been analysed according to well known phenomenological models.
Analysis of optical spectra of CdS and CdSe films deposited on a sapphire substrate by laser ablation technique
PERNA, GIUSEPPE;CAPOZZI, VITO GIACOMO
2002-01-01
Abstract
CdSe and US F. films, deposited on a sapphire substrate by means of pulsed laser ablation technique, have been investigated by means of reflectivity and photoluminescence measurements in order to study the effect of such a transparent substrate on the optical properties of the deposited epilayers. The reflectivity spectra at low temperature have been studied by means of an analytical model which permits one to obtain the energies of the excitonic resonances. The photoluminescence spectra show that our CdSe and US films present excitonic emission at low temperature, differently from the same films deposited on quartz. The temperature dependence of the excitonic energy has been analysed by taking into account the contribution of both the thermal expansion and electron-phonon interaction. The exciton linewidth has been analysed according to well known phenomenological models.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.