Transmission and reflectance spectra of fullerite C-60 thin films deposited on quartz and Si substrates are presented. An Urbach tail of states is present below the absorption edge due to the disordered structure of films. Photoluminescence (PL) spectra have been measured from 10 to 300 K. The recombination line of a self-trapped exciton polaron and its phonon replicas are present in the PL spectra.

Optical Characterization of Fullerite C60 Thin Films

CAPOZZI, VITO GIACOMO;
1996-01-01

Abstract

Transmission and reflectance spectra of fullerite C-60 thin films deposited on quartz and Si substrates are presented. An Urbach tail of states is present below the absorption edge due to the disordered structure of films. Photoluminescence (PL) spectra have been measured from 10 to 300 K. The recombination line of a self-trapped exciton polaron and its phonon replicas are present in the PL spectra.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11369/4828
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