A mild wet nitridation procedure using hydrazine-based solutions has been developed for GaAs (100) surface passivation. Both x-ray photoelectron spectroscopy and spectroscopic ellipsometry show that this nitridation procedure results in a very thin, coherent, and homogeneous GaN layer that is very stable in air. Photoluminescence data show a strong enhancement of the intensity as compared to that of an as-cleaned GaAs sample, indicating that this nitrided layer provides both chemical and electronic passivation of GaAs surfaces. The chemical mechanism of nitridation is discussed

Wet chemical nitridation of GaAs (100) by hydrazine solution for surface passivation

PERNA, GIUSEPPE;CAPOZZI, VITO GIACOMO
2002-01-01

Abstract

A mild wet nitridation procedure using hydrazine-based solutions has been developed for GaAs (100) surface passivation. Both x-ray photoelectron spectroscopy and spectroscopic ellipsometry show that this nitridation procedure results in a very thin, coherent, and homogeneous GaN layer that is very stable in air. Photoluminescence data show a strong enhancement of the intensity as compared to that of an as-cleaned GaAs sample, indicating that this nitrided layer provides both chemical and electronic passivation of GaAs surfaces. The chemical mechanism of nitridation is discussed
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11369/16672
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